Non-contact optical profile meter «NanoScan-01» can be used in the field of measuring surface roughness parameters on coated and uncoated optics, and other polished and specular surfaces with angstrom level repeatability and precision.
Non-contact optical profile meter - microinterferometer "NanoScan-01" is made according to the Linnik's scheme. With the use of a Linnik configuration, the device provides superior lateral resolution over a larger field of view with greater working distance and surface measurement fidelity.
«NanoScan-01» optical surface roughness profile meter utilizes the Dynamic Interferometry method with phase shifting data acquisition analyses and a high-speed optical sensor. Includes special software and provides extensive 2D and 3D analysis options, data filtering, masking and import/export functions. «NanoScan-01» can be easily positioned on large parts by mounted on a robotic arm to have possibility to measure surface parameters anywhere on large-sized products inside stations and polishing equipment multiple parts arrayed on a table directly on large optics and mirror segments.
To study large-sized optical products, the microinterferometer may be equipped with a CNC portal, which can move the microinterferometer in three spatial directions - in horizontal X, Y and vertical Z (accuracy of movement along the axes 0.01 mm). -Optional, not included in the basic package